Constructing interaction test suites with greedy algorithms

Combinatorial approaches to testing are used in several fields, and have recently gained momentum in the field of software testing through software interaction testing. One-test-at-atime greedy algorithms are used to automatically construct such test suites. This paper discusses basic criteria of why greedy algorithms have been appropriate for this test generation problem in the past and then expands upon how greedy algorithms can be utilized to address test suite prioritization. Categories and Subject Descriptors D.2.5 [Software Engineering]: Testing and Debugging— testing tools General Terms Algorithms, Measurement, Experimentation Keywords Biased covering arrays, covering arrays, greedy algorithm, mixed-level covering arrays, t-way interaction coverage, software interaction testing

• Type: Conference
• Year: 2005
• Where: KBSE
• Authors: Renée C. Bryce, Charles J. Colbourn
• Keywords: Greedy Algorithm, KBSE 2005, One-test-at-atime Greedy Algorithms, Software Engineering, Software Interaction Testing