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ISQED
2007
IEEE

A Data-Driven Statistical Approach to Analyzing Process Variation in 65nm SOI Technology

13 years 10 months ago
A Data-Driven Statistical Approach to Analyzing Process Variation in 65nm SOI Technology
Choongyeun Cho, Daeik D. Kim, Jonghae Kim, Jean-Ol
Added 04 Jun 2010
Updated 04 Jun 2010
Type Conference
Year 2007
Where ISQED
Authors Choongyeun Cho, Daeik D. Kim, Jonghae Kim, Jean-Olivier Plouchart, Daihyun Lim, Sangyeun Cho, Robert Trzcinski
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