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AIPR
2003
IEEE

Defect Detection on Patterned Jacquard Fabric

9 years 3 months ago
Defect Detection on Patterned Jacquard Fabric
The techniques for defect detection on plain (unpatterned) fabrics have been well developed nowadays. This paper is on developing visual inspection methods for defect detection on patterned fabrics. A review on some defect detection methods on patterned fabrics will be given. Then, a new method for patterned fabric inspection called Golden Image Subtraction (GIS) is introduced. GIS is an efficient and fast method, which can segment out the defective regions on patterned fabric effectively. An improved version of the GIS method using wavelet transform is also given. This research result will contribute to the development of an automated fabric inspection machine for the textile industry.
Henry Y. T. Ngan, Grantham K. H. Pang, S. P. Yung,
Added 23 Aug 2010
Updated 23 Aug 2010
Type Conference
Year 2003
Where AIPR
Authors Henry Y. T. Ngan, Grantham K. H. Pang, S. P. Yung, Michael K. Ng
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