Defect Detection on Patterned Jacquard Fabric

The techniques for defect detection on plain (unpatterned) fabrics have been well developed nowadays. This paper is on developing visual inspection methods for defect detection on patterned fabrics. A review on some defect detection methods on patterned fabrics will be given. Then, a new method for patterned fabric inspection called Golden Image Subtraction (GIS) is introduced. GIS is an efficient and fast method, which can segment out the defective regions on patterned fabric effectively. An improved version of the GIS method using wavelet transform is also given. This research result will contribute to the development of an automated fabric inspection machine for the textile industry.

• Type: Conference
• Year: 2003
• Where: AIPR
• Authors: Henry Y. T. Ngan, Grantham K. H. Pang, S. P. Yung, Michael K. Ng
• Keywords: AIPR 2003, Defect Detection, Pattern Recognition, Patterned Fabric, Patterned Fabric Inspection