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FCCM
2006
IEEE

Defect-Tolerant Nanocomputing Using Bloom Filters

9 years 7 months ago
Defect-Tolerant Nanocomputing Using Bloom Filters
We propose a novel defect-tolerant design methodology using Bloom filters for defect mapping for nanoscale computing devices. It is a general approach that can be used for any permanent defects incurred during the manufacturing process. Our redundant design methodology does not rely on a voting strategy, thus it utilizes the device redundancy more effectively than existing approaches. Additionally, our method does not have false-positive in defect identification, i.e. it will not report a defective device as functional. Moreover, it is very space economic and can be programmed to fit different scales and characteristics of the underlying specific nanoscale devices used in the system.
Gang Wang, Wenrui Gong, Ryan Kastner
Added 11 Jun 2010
Updated 11 Jun 2010
Type Conference
Year 2006
Where FCCM
Authors Gang Wang, Wenrui Gong, Ryan Kastner
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