Deterministic partitioning techniques for fault diagnosis in scan-based BIST

A deterministic partitioning technique for fault diagnosis in Scan-Based BIST is proposed. Properties of high quality partitions for improved fault diagnosis times are identified and low cost hardware implementations of high quality deterministic partitions are outlined. The superiority of the partitions generated by the proposed approach is confirmed through mathematical analysis. Theoretical analyses, worst case bounds, and experimental simulation data all confirm the superiority of the proposed deterministic approaches.

• Type: Conference
• Year: 2000
• Where: ITC
• Authors: Ismet Bayraktaroglu, Alex Orailoglu
• Keywords: Deterministic Partitioning Technique, Fault Diagnosis, Hardware, ITC 2000, Quality Deterministic Partitions