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ICSE
2008
IEEE-ACM

The effect of program and model structure on mc/dc test adequacy coverage

10 years 8 months ago
The effect of program and model structure on mc/dc test adequacy coverage
Ajitha Rajan, Michael W. Whalen, Mats Per Erik Hei
Added 17 Nov 2009
Updated 17 Nov 2009
Type Conference
Year 2008
Where ICSE
Authors Ajitha Rajan, Michael W. Whalen, Mats Per Erik Heimdahl
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