Sciweavers

Share
ETFA
2008
IEEE

Efficient failure-free foundry production

9 years 8 months ago
Efficient failure-free foundry production
Microshrinkages are known as probably the most difficult defects to avoid in high-precission foundry. Depending on the magnitude of this defect, the piece in which it appears must be rejected with the subsequent cost increment. Modelling this environment as a probabilistic constellation of interrelated variables allows Bayesian networks to infer causal relationships. In other words, they may guess the value of a variable (for instance, the presence or not of a defect). Against this background, we present here the first microshrinkage prediction system that, upon the basis of a Bayesian network, is able to foresee the apparition of this defect and to determine whether the piece is still acceptable or not. Further, after testing this system in a real foundry, we discuss the obtained results and present a risk-level-based production methodology that increases the rate of valid manufactured pieces.
Yoseba K. Penya, Pablo Garcia Bringas, Argoitz Zab
Added 19 Oct 2010
Updated 19 Oct 2010
Type Conference
Year 2008
Where ETFA
Authors Yoseba K. Penya, Pablo Garcia Bringas, Argoitz Zabala
Comments (0)
books