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DATE
2008
IEEE

Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies

13 years 10 months ago
Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies
Georges G. E. Gielen, P. De Wit, Elie Maricau, J.
Added 29 May 2010
Updated 29 May 2010
Type Conference
Year 2008
Where DATE
Authors Georges G. E. Gielen, P. De Wit, Elie Maricau, J. Loeckx, J. Martin-Martinez, Ben Kaczer, Guido Groeseneken, R. Rodríguez, M. Nafría
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