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EVOW
2008
Springer

An Evolutionary Methodology for Test Generation for Peripheral Cores Via Dynamic FSM Extraction

8 years 11 months ago
An Evolutionary Methodology for Test Generation for Peripheral Cores Via Dynamic FSM Extraction
Traditional test generation methodologies for peripheral cores are performed by a skilled test engineer, leading to long generation times. In this paper a test generation methodology based on an evolutionary tool which exploits high level metrics is presented. To strengthen the correlation between high-level coverage and the gate-level fault coverage, in the case of peripheral cores, the FSMs embedded in the system are identified and then dynamically extracted via simulation, while transition coverage is used as a measure of how much the system is exercised. The results obtained by the evolutionary tool outperform those obtained by a skilled engineer on the same benchmark.
Danilo Ravotto, Ernesto Sánchez, Massimilia
Added 19 Oct 2010
Updated 19 Oct 2010
Type Conference
Year 2008
Where EVOW
Authors Danilo Ravotto, Ernesto Sánchez, Massimiliano Schillaci, Giovanni Squillero
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