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DFT
2008
IEEE

Exploring Density-Reliability Tradeoffs on Nanoscale Substrates: When do smaller less reliable devices make sense?

8 years 11 months ago
Exploring Density-Reliability Tradeoffs on Nanoscale Substrates: When do smaller less reliable devices make sense?
It is widely recognized that device and interconnect fabrics at the nanoscale will be characterized by an increased susceptibility to transient faults. This appears to be intrinsic to nanoscale regimes and fundamentally limits the eventual benefits of the increased device density, i.e., the overheads associated with achieving fault-tolerance may counter the benefits of increased device density – density-reliability tradeoff. At the same time, as devices scale down one can expect a higher proportion of area to be associated with interconnection, i.e., area is wire dominated. This paper theoretically explores density-reliability tradeoffs in wire dominated integrated systems. We derive an area scaling model based on simple assumptions capturing the salient features of hierarchical design for high performance systems. We then evaluate overheads associated with using basic fault-tolerance techniques at different levels of the design hierarchy. This, albeit simplified model, allows us...
Andrey V. Zykov, Gustavo de Veciana
Added 29 May 2010
Updated 29 May 2010
Type Conference
Year 2008
Where DFT
Authors Andrey V. Zykov, Gustavo de Veciana
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