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CLEF
2010
Springer

External Plagiarism Detection Based on Standard IR Technology and Fast Recognition of Common Subsequences - Lab Report for PAN a

13 years 4 months ago
External Plagiarism Detection Based on Standard IR Technology and Fast Recognition of Common Subsequences - Lab Report for PAN a
The plagiarism detection system described in this paper is aiming at bringing external plagiarism detection to the desktop. The main ideas are to incorporate standard IR technologies for the candidate selection and efficient data structures for the detailed analysis between a suspicious and a candidate document. Given that the system so far has only reached prototype status, the first results look promising.
Thomas Gottron
Added 08 Nov 2010
Updated 08 Nov 2010
Type Conference
Year 2010
Where CLEF
Authors Thomas Gottron
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