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2009
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Fault-Based Test Case Generation for Component Connectors

9 years 6 months ago
Fault-Based Test Case Generation for Component Connectors
The complex interactions appearing in service-oriented computing make coordination a key concern in serviceoriented systems. In this paper, we present a fault-based method to generate test cases for component connectors from specifications. For connectors, faults are caused by possible errors during the development process, such as wrongly used channels, missing or redundant subcircuits, or circuits with wrongly constructed topology. We give test cases and connectors a unifying formal semantics by using the notion of design, and generate test cases by solving constraints obtained from the specification and faulty connectors. A prototype symbolic test case generator serves to demonstrate the automatizing of the approach.
Bernhard K. Aichernig, Farhad Arbab, Lacramioara A
Added 21 May 2010
Updated 21 May 2010
Type Conference
Year 2009
Where TASE
Authors Bernhard K. Aichernig, Farhad Arbab, Lacramioara Astefanoaei, Frank S. de Boer, Sun Meng, Jan J. M. M. Rutten
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