Fault Clustering in deep-submicron CMOS Processes

The fraction of ICs that pass all production tests but fail in the application is called the defect level. Defect levels depend on the average number of defects per IC, and also on the clustering of these defects. High clustering leads to a higher yield and a lower defect level. This paper compiles the coefficients for defect clustering

• Type: Conference
• Year: 2008
• Where: DATE
• Authors: Jan Schat
• Keywords: DATE 2008, Defect Clustering, Defect Level, Hardware, Lower Defect Level