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ITC
2003
IEEE

Fault Localization using Time Resolved Photon Emission and STIL Waveforms

13 years 9 months ago
Fault Localization using Time Resolved Photon Emission and STIL Waveforms
Faster defect localization is achieved by combining IC simulations and internal measurements. Time resolved photon emission records photons emitted during commutations (current) rather than determining the voltage states. Comparing measured waveforms with simulations (STIL/VCD) localizes functional faults and timing issues. Summary Software diagnosis makes it possible to investigate many IC defects with fault simulation tools. Internal probing techniques, such as time resolved photon emission (TRP), can access "otherwise inaccessible" nodes. Hardware diagnosis can fine-tune the defect analyses and validate simulations by contributing "actual" measurements. The combination of software diagnosis and internal probing can reduce simulation time and internal measurements for faster localization of the defect. The challenge is to determine quickly if a measurement is good or not: Can some signal be measured (the transistor is at least activated)? Are the measured delays ...
Romain Desplats, Felix Beaudoin, Philippe Perdu, N
Added 04 Jul 2010
Updated 04 Jul 2010
Type Conference
Year 2003
Where ITC
Authors Romain Desplats, Felix Beaudoin, Philippe Perdu, Nagamani Nataraj, Ted Lundquist, Ketan Shah
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