First IC Validation of IEEE Std. 1149.6

–This paper provides proof of concept for the newly-approved 1149.6 standard by investigating the first silicon implementation of the test receiver. EXTEST and EXTEST_PULSE tests were applied to functional channels as well as channels with a set of externally-induced hard defects. All valid signals were correctly received, and all defects were detected, thus validating both 1149.6’s anticipated backwards compatibility with 1149.1 and fault coverage. Mission-mode tests showed no performance degradation due to the test circuits. Characterization across PVT of the test receiver suggests 1149.6’s robustness with respect to noise.

• Type: Conference
• Year: 2003
• Where: ITC
• Authors: Suzette Vandivier, Mark Wahl, Jeff Rearick
• Keywords: Externally-induced Hard Defects, Hardware, ITC 2003, Paper Provides Proof, Test Receiver