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2003

Function Test Framework for Testing IO-Blocks in a Model-Based Rapid Prototyping Development Environment for Embedded Control Ap

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Function Test Framework for Testing IO-Blocks in a Model-Based Rapid Prototyping Development Environment for Embedded Control Ap
— Testing and verification are important methods for gaining confidence in the reliability of a software product. Keeping this confidence up is especially difficult for software that has to follow fast changing development cycles or that is targeted at many platforms. In this paper we present a test framework for creating and executing function (blackbox) tests of I/O control blocks, which are part of a model-based rapid-prototyping development environment for distributed embedded control applications. The framework supports test engineers by trying to minimize their required effort for specification, setup, and execution of tests. This is achieved by defining test environment specifications that decouple the test specification from many properties of the test environment. The same mechanisms are also used to improve the test-cycle turn-around time for large test suites by supporting the automated parallelization of tests for efficiently distributing them over the available ...
Stefan Pitzek, Peter P. Puschner
Added 01 Nov 2010
Updated 01 Nov 2010
Type Conference
Year 2003
Where WISES
Authors Stefan Pitzek, Peter P. Puschner
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