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DAC
1994
ACM

Functional Test Generation for FSMs by Fault Extraction

9 years 3 months ago
Functional Test Generation for FSMs by Fault Extraction
Recent results indicate that functional test pattern generation (TPG) techniques may provide better defect coverages than do traditional logic-level techniques. Functional TPG algorithms utilize a functional description of a circuit. Multilevel TPG algorithms attempt to realize the advantages of both approaches through fault translation. In such systems, gate-level faults are translated to functional faults and TPG is performed at the functional level. We develop and present new techniques for fast ecient fault translation from the logic to the functional level. These techniques are implemented in a multi-level sequential circuit test generation system. Performance results for benchmark circuits are presented.
Bapiraju Vinnakota, Jason Andrews
Added 09 Aug 2010
Updated 09 Aug 2010
Type Conference
Year 1994
Where DAC
Authors Bapiraju Vinnakota, Jason Andrews
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