Sciweavers

Share
ICCD
2001
IEEE

A Functional Validation Technique: Biased-Random Simulation Guided by Observability-Based Coverage

10 years 11 months ago
A Functional Validation Technique: Biased-Random Simulation Guided by Observability-Based Coverage
We present a simulation-based semi-formal verification method for sequential circuits described at the registertransfer level. The method consists of an iterative loop where coverage analysis guides input pattern generation. An observability-based coverage metric is used to identify portions of the circuit not exercised by simulation. A heuristic algorithm then selects probability distributions for biased random input pattern generation that targets noncovered portions. This algorithm is based on an approximate analysis of the circuit modeled as a Markov chain at steady state. Node controllabilities and observabilities are estimated using a limited depth reconvergence analysis and an implicit algorithm for manipulating probability distributions and determining steady-state behavior. An optimization algorithm iteratively perturbs the probability distributions of the primary inputs in order to improve estimated coverage. The coverage enhancement achieved by our approach is demonstrated...
Serdar Tasiran, Farzan Fallah, David G. Chinnery,
Added 16 Mar 2010
Updated 16 Mar 2010
Type Conference
Year 2001
Where ICCD
Authors Serdar Tasiran, Farzan Fallah, David G. Chinnery, Scott J. Weber, Kurt Keutzer
Comments (0)
books