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DATE
2009
IEEE

Gate replacement techniques for simultaneous leakage and aging optimization

9 years 6 months ago
Gate replacement techniques for simultaneous leakage and aging optimization
—1As technology scales, the aging effect caused by Negative Bias Temperature Instability (NBTI) has become a major reliability concern for circuit designers. On the other hand, reducing leakage power remains to be one of the design goals. Because both NBTIinduced circuit degradation and standby leakage power have a strong dependency on the input vectors, Input Vector Control (IVC) technique may be adopted to mitigate leakage and NBTI. However, IVC technique is in-effective for larger circuits. Therefore, in this paper, we propose two fast gate replacement algorithms together with optimal input vector selection to simultaneously mitigate leakage power and NBTI induced circuit degradation: Direct Gate Replacement (DGR) algorithm and Divide and Conquer Based Gate Replacement (DCBGR) algorithm. Our experimental results on 20 benchmark circuits at 65nm technology node reveal that: 1) Both DGR and DCBGR algorithms outperform pure IVC about on average 20% for three different object function...
Yu Wang 0002, Xiaoming Chen, Wenping Wang, Yu Cao,
Added 20 May 2010
Updated 20 May 2010
Type Conference
Year 2009
Where DATE
Authors Yu Wang 0002, Xiaoming Chen, Wenping Wang, Yu Cao, Yuan Xie, Huazhong Yang
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