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ASPDAC
2008
ACM

GECOM: Test data compression combined with all unknown response masking

10 years 4 months ago
GECOM: Test data compression combined with all unknown response masking
This paper introduces GECOM technology, a novel test compression method with seamless integration of test GE
Youhua Shi, Nozomu Togawa, Masao Yanagisawa, Tatsu
Added 12 Oct 2010
Updated 12 Oct 2010
Type Conference
Year 2008
Where ASPDAC
Authors Youhua Shi, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki
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