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2005
IEEE

High Quality Uniform Random Number Generation Through LUT Optimised Linear Recurrences

9 years 11 months ago
High Quality Uniform Random Number Generation Through LUT Optimised Linear Recurrences
This paper describes a class of FPGA-specific uniform random number generators with a 2k −1 length period, which can provide k random bits per-cycle for the cost of k Lookup Tables (LUTs) and k flip-flops. The generator is based on a binary linear recurrence, but with a recurrence matrix optimised for LUT based architectures. It avoids many of the problems and inefficiencies associated with LFSRs and Tausworthe generators, while retaining the ability to efficiently skip ahead in the sequence. In particular we show that this class of generators produce the highest sample rate for a given area compared to LFSR and Tausworthe generators. The statistical quality of this type of generators is very good, and can be used to create small and fast generators with long periods which pass all common empirical tests, such as Diehard, Crush, Big-Crush and the NIST cryptographic tests.
David B. Thomas, Wayne Luk
Added 24 Jun 2010
Updated 24 Jun 2010
Type Conference
Year 2005
Where FPT
Authors David B. Thomas, Wayne Luk
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