IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults

– We propose an interconnect diagnosis scheme based on Oscillation Ring test methodology for SOC design with heterogeneous cores. The target fault models are delay faults and crosstalk glitches. We analyze the diagnosability of an interconnect structure and propose a fast diagnosability checking algorithm and an efficient diagnosis ring generation algorithm which achieves the optimal diagnosability. Two optimization techniques improve the efficiency and effectiveness of interconnect diagnosis. In all experiments, our method achieves 100% fault coverage and the optimal diagnosis resolution.

• Type: Conference
• Year: 2006
• Where: ASPDAC
• Authors: Katherine Shu-Min Li, Yao-Wen Chang, Chauchin Su, Chung-Len Lee, Jwu E. Chen
• Keywords: ASPDAC 2006, Diagnosis Ring Generation, Interconnect Diagnosis, Interconnect Diagnosis Scheme