Immediate Neighbor Difference IDDQ Test (INDIT) for Outlier Identification

Increasing values and spread in leakage current makes it impossible to distinguish between faulty and fault-free chips using single threshold method. Neighboring chips on a wafer have similar fault-free properties. By obtaining differences in IDDQ values it is possible to discriminate faulty dice. In this paper, a technique in which comparison of IDDQ of a die with that of its neighboring dice on the wafer is evaluated. The analysis based on the SEMATECH test data? is presented.

• Type: Conference
• Year: 2003
• Where: VLSID
• Authors: Sagar S. Sabade, D. M. H. Walker
• Keywords: Computer Architecture, Faulty Dice, Neighboring Dice, SEMATECH Test Data, VLSID 2003