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PR
2006

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Improved Bayesian image denoising based on wavelets with applications to electron microscopy

13 years 4 months ago

Improved Bayesian image denoising based on wavelets with applications to electron microscopy

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Carlos Oscar Sánchez Sorzano, E. Ortiz, M.

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Added	14 Dec 2010
Updated	14 Dec 2010
Type	Journal
Year	2006
Where	PR
Authors	Carlos Oscar Sánchez Sorzano, E. Ortiz, M. López, J. Rodrigo

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