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11

DAC
2000
ACM

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Improved fault diagnosis in scan-based BIST via superposition

14 years 5 months ago

Improved fault diagnosis in scan-based BIST via superposition

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Ismet Bayraktaroglu, Alex Orailoglu

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DAC 2000 | Design Automation | Scan-based Bist |

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Added	13 Nov 2009
Updated	13 Nov 2009
Type	Conference
Year	2000
Where	DAC
Authors	Ismet Bayraktaroglu, Alex Orailoglu

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