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    VTS
    1996
    IEEE
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    Improvement of SRAM-based failure analysis using calibrated Iddq testing

    13 years 8 months ago
    Improvement of SRAM-based failure analysis using calibrated Iddq testing
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    Hari Balachandran, D. M. H. Walker
    claim paper
    Added 07 Aug 2010
    Updated 07 Aug 2010
    Type Conference
    Year 1996
    Where VTS
    Authors Hari Balachandran, D. M. H. Walker
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