Improving test quality using robust unique input/output circuit sequences (UIOCs)

In finite state machine (FSM) based testing, the problem of fault masking in the unique input/output (UIO) sequence may degrade the test performance of the UIO based methods. This paper investigated this problem and proposed the use of a new type of unique input/output circuit (UIOC) sequence for state verification, which may help to overcome the drawbacks that exist in the UIO based techniques. When constructing a UIOC, overlap and internal state observation schema are used to increase the robustness of a test sequence. Test quality was compared by using the forward UIO method (F-method), the backward UIO method (B-method) and the UIOC method (C-method) separately. Robustness of the UIOCs constructed by the algorithm given in this paper was also compared with those constructed by the algorithm given previously. Experimental results suggested that the C- method outperforms the Fand the B- methods and the UIOCs constructed by the algorithm given in this paper are more robust than those...

• Type: Journal
• Year: 2006
• Where: INFSOF
• Authors: Qiang Guo, Robert M. Hierons, Mark Harman, Karnig Derderian
• Keywords: INFSOF 2006, State Observation Schema, UIO Based Methods, UIO Based Techniques