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ECCV
2004
Springer

The Isophotic Metric and Its Application to Feature Sensitive Morphology on Surfaces

14 years 6 months ago
The Isophotic Metric and Its Application to Feature Sensitive Morphology on Surfaces
Helmut Pottmann, Tibor Steiner, Michael Hofer, Chr
Added 15 Oct 2009
Updated 15 Oct 2009
Type Conference
Year 2004
Where ECCV
Authors Helmut Pottmann, Tibor Steiner, Michael Hofer, Christoph Haider, Allan Hanbury
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