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DATE
2010
IEEE

IVF: Characterizing the vulnerability of microprocessor structures to intermittent faults

10 years 9 months ago
IVF: Characterizing the vulnerability of microprocessor structures to intermittent faults
—With the advancement of CMOS manufacturing process to nano-scale, future shipped microprocessors will be increasingly vulnerable to intermittent faults. Quantitatively characterizing the vulnerability of microprocessor structures to intermittent faults at early design stage is significantly helpful to balance system performance and reliability. Prior researches have proposed several metrics to characterize the vulnerability of microprocessor structures to soft errors and permanent faults, however, the vulnerability of these structures to intermittent faults are still rarely considered. In this work, we propose a metric intermittent vulnerability factor (IVF) to characterize the vulnerability of microprocessor structures to intermittent faults. A structure’s IVF is the probability an intermittent fault in that structure causes an external visible error. We instrument a cycle-accurate execution-driven simulator Sim-Alpha to compute IVFs for reorder buffer and register file. Experime...
Songjun Pan, Yu Hu, Xiaowei Li
Added 10 Jul 2010
Updated 10 Jul 2010
Type Conference
Year 2010
Where DATE
Authors Songjun Pan, Yu Hu, Xiaowei Li
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