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ICCAD
2006
IEEE

Joint design-time and post-silicon minimization of parametric yield loss using adjustable robust optimization

9 years 9 months ago
Joint design-time and post-silicon minimization of parametric yield loss using adjustable robust optimization
Parametric yield loss due to variability can be effectively reduced by both design-time optimization strategies and by adjusting circuit parameters to the realizations of variable parameters. The two levels of tuning operate within a single variability budget, and because their effectiveness depends on the magnitude and the spatial structure of variability their joint co-optimization is required. In this paper we develop a formal optimization algorithm for such co-optimization and link it to the control and measurement overhead via the formal notions of measurement and control complexity. We describe an optimization strategy that unifies design-time gate-level sizing and post-silicon adaptation using adaptive body bias at the chip level. The statistical formulation utilizes adjustable robust linear programming to derive the optimal policy for assigning body bias once the uncertain variables, such as gate length and threshold voltage, are known. Computational tractability is achieved b...
Murari Mani, Ashish Kumar Singh, Michael Orshansky
Added 16 Mar 2010
Updated 16 Mar 2010
Type Conference
Year 2006
Where ICCAD
Authors Murari Mani, Ashish Kumar Singh, Michael Orshansky
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