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ICPR
2002
IEEE

Linear and Non-Linear Model for Statistical Localization of Landmarks

14 years 5 months ago
Linear and Non-Linear Model for Statistical Localization of Landmarks
This paper presents and compares 3 methods for the statistical localization of partially occulted landmarks. In many real applications, some information is visible in images and some parts are missing or occulted. These parts are estimated by 3 statistical approaches : a rigid registration, a linear method derived from PCA, which represents spatial relationships, and a non linear model based upon Kernel PCA. Applied to the cephalometric problem, the best method exhibits a mean error of 3.3 mm, which is about 3 times the intra-expert variability.
Barbara Romaniuk, Michel Desvignes, Marinette Reve
Added 09 Nov 2009
Updated 09 Nov 2009
Type Conference
Year 2002
Where ICPR
Authors Barbara Romaniuk, Michel Desvignes, Marinette Revenu, Marie-Josèphe Deshayes
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