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2002
IEEE

Losses in Multilevel Crossover in VLSI Interconnects

10 years 11 months ago
Losses in Multilevel Crossover in VLSI Interconnects
The radiation and surface wave losses may give rise to electromagnetic interference (EMI) problems in high speed VLSI interconnects. Over and above there will be dielectric and conductor losses. These losses have been evaluated for multilevel interconnects by finite difference time domain (FDTD) technique. The crosstalk between lines in the same level as well as in different levels and propagation delays are also found.
P. K. Datta, S. Sanyal, D. Bhattacharya
Added 01 Dec 2009
Updated 01 Dec 2009
Type Conference
Year 2002
Where VLSID
Authors P. K. Datta, S. Sanyal, D. Bhattacharya
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