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ITC
2003
IEEE

Low Contact-Force Fritting Probe Card Using Buckling Microcantilevers

13 years 9 months ago
Low Contact-Force Fritting Probe Card Using Buckling Microcantilevers
Kenichi Kataoka, Toshihiro Itoh, Tadatomo Suga
Added 04 Jul 2010
Updated 04 Jul 2010
Type Conference
Year 2003
Where ITC
Authors Kenichi Kataoka, Toshihiro Itoh, Tadatomo Suga
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