Sciweavers

Share
ICCD
2002
IEEE

Low Power Mixed-Mode BIST Based on Mask Pattern Generation Using Dual LFSR Re-Seeding

10 years 2 months ago
Low Power Mixed-Mode BIST Based on Mask Pattern Generation Using Dual LFSR Re-Seeding
Low power design techniques have been employed for more than two decades, however an emerging problem is satisfying the test power constraints for avoiding destructive test and improving the yield. Our research addresses this problem by proposing a new method which maintains the benefits of mixed-mode built-in self-test (BIST) (low test application time and high fault coverage), and reduces the excessive power dissipation associated with scan-based test. This is achieved by employing dual linear feedback shift register (LFSR) re-seeding and generating mask patterns to reduce the switching activity. Theoretical analysis and experimental results show that the proposed method consistently reduces the switching activity by 25% when compared to the traditional approaches, at the expense of a limited increase in storage requirements.
Paul M. Rosinger, Bashir M. Al-Hashimi, Nicola Nic
Added 16 Mar 2010
Updated 16 Mar 2010
Type Conference
Year 2002
Where ICCD
Authors Paul M. Rosinger, Bashir M. Al-Hashimi, Nicola Nicolici
Comments (0)
books