Sciweavers

ICCAD
2003
IEEE

Manufacturing-Aware Physical Design

14 years 15 days ago
Manufacturing-Aware Physical Design
Ultra-deep submicron manufacturability impacts physical design (PD) through complex layout rules and large guardbands for process variability; this creates new requirements for new manufacturing-aware PD technologies. The first part of this tutorial reviews PD complications and methodology changes - notably in the detailed routing arena - that arise from subwavelength lithography and deep-submicron manufacturing (antennas, metal planarization and maskwafer mismatch). Process variations and their sources are taxonomized for modeling and simulation. A framework of design for cost and value is described. The second part covers yield-constrained optimizations in PD, especially “beyond corners” approaches that escape today’s pessimistic or even incorrect corner-based approaches. Statistical timing and noise analyses enable optimization of parametric yield and reliability. Yield-aware cell libraries and “analog” design rules (as opposed to “digital”, 0/1 rules) can help desig...
Puneet Gupta, Andrew B. Kahng
Added 16 Mar 2010
Updated 16 Mar 2010
Type Conference
Year 2003
Where ICCAD
Authors Puneet Gupta, Andrew B. Kahng
Comments (0)