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METRICS
2003
IEEE

Measuring and Improving Design Patterns Testability

10 years 2 months ago
Measuring and Improving Design Patterns Testability
This paper addresses not only the question of testability measurement of OO designs but also focuses on its practicability. While detecting testability weaknesses (called testability anti-patterns) of an OO design is a crucial task, one cannot expect from a non-specialist to make the right improvements, without guidance or automation. To overcome this limitation, this paper investigates solutions integrated to the 00 process. We focus on the design patterns as coherent subsets in the architecture, and we explain how their use can provide a way for limiting the severity of testability weaknesses, and of confining their effects to the classes involved in the pattern. Indeed, design patterns appear both as a usual refinement instrument, and a cause of complex interactions into a class diagram – and more specifically of testability anti-patterns. To reach our objective of integrating the testability improvement to the design process, we propose first a testability grid to make the relat...
Benoit Baudry, Yves Le Traon, Gerson Sunyé,
Added 05 Jul 2010
Updated 05 Jul 2010
Type Conference
Year 2003
Where METRICS
Authors Benoit Baudry, Yves Le Traon, Gerson Sunyé, Jean-Marc Jézéquel
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