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DAC
2000
ACM

Modeling and simulation of real defects using fuzzy logic

13 years 8 months ago
Modeling and simulation of real defects using fuzzy logic
Real defects (e.g. stuck-at or bridging faults) in the VLSI circuits cause intermediate voltages and can not be modeled as ideal shorts. In this paper we first show that the traditional zero-resistance model is not sufficient. Then, we present a resistive fault model for real defects and use fuzzy logic techniques for fault simulation and test pattern generation at the gate-level. Our method produces more realistic fault coverage compared to the conventional methods. The experimental results include the fault coverage and test pattern statistics for the ISCAS85 benchmarks.
Amir Attarha, Mehrdad Nourani, Caro Lucas
Added 01 Aug 2010
Updated 01 Aug 2010
Type Conference
Year 2000
Where DAC
Authors Amir Attarha, Mehrdad Nourani, Caro Lucas
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