| Modeling of NBTI-Induced PMOS Degradation under Arbitrary Dynamic Temperature Variation Recent countries visiting this post |  |
 | 5 | United States |
 | 4 | |
 | 1 | Japan |
| Modeling of NBTI-Induced PMOS Degradation under Arbitrary Dynamic Temperature Variation Recent countries visiting this post | |
| 5 | United States |
| 4 | |
| 1 | Japan |