Multi-Level Test Models for Embedded Systems

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Multi-Level Test Models for Embedded Systems
Abstract: Test methodologies for large embedded systems fail to reflect the test process as a whole. Instead, the test process is divided into independent test levels feaifferences like the functional abstraction levels, but also similarities such as many functional test cases. Desirable instruments such as test front-loading feature a considerable test effort and test cost reduction potential, but their efficiency suffers nowadays from the strict separation of the test levels and the consequent lack of appropriate mechanisms for reusing tests across test levels. Multi-level test cases have shown to provide the means for a seamless test level integration based on test case reuse across test levels. This paper extends this concept by introducing multi-level test hich are capable of systematically integrating different functional abstraction levels. From these models, we can derive multi-level test cases that are executable at different test levels. With this novel approach, multi-level ...
Abel Marrero Pérez, Stefan Kaiser
Added 29 Oct 2010
Updated 29 Oct 2010
Type Conference
Year 2010
Where SE
Authors Abel Marrero Pérez, Stefan Kaiser
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