Multi-temperature testing for core-based system-on-chip

—Recent research has shown that different defects can manifest themselves as failures at different temperature spectra. Therefore, we need multi-temperature testing which applies tests at different temperature levels. In this paper, we discuss the need and problems for testing core-based systems-on-chip at different temperatures. To address the long test time problem for multitemperature test, we propose a test scheduling technique that generates the shortest test schedules while keeping the cores under test within a temperature interval. Experimental results show the efficiency of the proposed technique.

• Type: Conference
• Year: 2010
• Where: DATE
• Authors: Zhiyuan He, Zebo Peng, Petru Eles
• Keywords: DATE 2010, Test Scheduling Technique, Test Time Problem, Testing Core-based Systems-on-chip