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7

DATE
2005
IEEE

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New Schemes for Self-Testing RAM

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New Schemes for Self-Testing RAM

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This paper gives an overview of a new technique, named pseudo-ring testing (PRT). PRT can be applied for testing wide type of random access memories (RAM): bitor word-oriented and single- or dual-port RAM’s. An essential particularity of the proposed methodology is the emulation of a linear automaton over Galois field by memory own components.

Ghenadie Bodean, D. Bodean, A. Labunetz

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DATE 2005 | Essential Particularity | Hardware | Random Access Memories | Testing Wide Type |

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Added	24 Jun 2010
Updated	24 Jun 2010
Type	Conference
Year	2005
Where	DATE
Authors	Ghenadie Bodean, D. Bodean, A. Labunetz

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