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CAIP
2003
Springer

A New Sharpness Measure Based on Gaussian Lines and Edges

10 years 5 days ago
A New Sharpness Measure Based on Gaussian Lines and Edges
Judith Dijk, Michael van Ginkel, Rutger J. van Ass
Added 06 Jul 2010
Updated 06 Jul 2010
Type Conference
Year 2003
Where CAIP
Authors Judith Dijk, Michael van Ginkel, Rutger J. van Asselt, Lucas J. van Vliet, Piet W. Verbeek
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