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4

CAIP
2003
Springer

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164views Image Analysis» more CAIP 2003»

A New Sharpness Measure Based on Gaussian Lines and Edges

13 years 9 months ago

A New Sharpness Measure Based on Gaussian Lines and Edges

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Judith Dijk, Michael van Ginkel, Rutger J. van Ass

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Added	06 Jul 2010
Updated	06 Jul 2010
Type	Conference
Year	2003
Where	CAIP
Authors	Judith Dijk, Michael van Ginkel, Rutger J. van Asselt, Lucas J. van Vliet, Piet W. Verbeek

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