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2002
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A New Test Generation Approach for Embedded Analogue Cores in SoC

10 years 9 months ago
A New Test Generation Approach for Embedded Analogue Cores in SoC
M. Stancic, L. Fang, M. H. H. Weusthof, R. M. W. T
Added 15 Jul 2010
Updated 15 Jul 2010
Type Conference
Year 2002
Where ITC
Authors M. Stancic, L. Fang, M. H. H. Weusthof, R. M. W. Tijink, Hans G. Kerkhoff
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