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14

ISCAS
2007
IEEE

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Noise Figure Measurement Using Mixed-Signal BIST

13 years 10 months ago

Noise Figure Measurement Using Mixed-Signal BIST

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—A Built-In Self-Test (BIST) approach for functionality measurements, including noise figure (NF), linearity and frequency response of analog circuitry in mixedsignal systems, is presented. The BIST circuitry consists of a direct digital synthesizer (DDS) based test pattern generator (TPG) and a multiplier/accumulator based output response analyzer (ORA). The BIST approach has been implemented in hardware and used for actual NF measurements for comparison with measurements from external test equipment.

Jie Qin, Charles E. Stroud, Foster F. Dai

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Actual Nf Measurements | BIST Circuitry | ISCAS 2007 | —a Built-in Self-test |

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Added	04 Jun 2010
Updated	04 Jun 2010
Type	Conference
Year	2007
Where	ISCAS
Authors	Jie Qin, Charles E. Stroud, Foster F. Dai

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