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ISCAS
2007
IEEE

Noise Figure Measurement Using Mixed-Signal BIST

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Noise Figure Measurement Using Mixed-Signal BIST
—A Built-In Self-Test (BIST) approach for functionality measurements, including noise figure (NF), linearity and frequency response of analog circuitry in mixedsignal systems, is presented. The BIST circuitry consists of a direct digital synthesizer (DDS) based test pattern generator (TPG) and a multiplier/accumulator based output response analyzer (ORA). The BIST approach has been implemented in hardware and used for actual NF measurements for comparison with measurements from external test equipment.
Jie Qin, Charles E. Stroud, Foster F. Dai
Added 04 Jun 2010
Updated 04 Jun 2010
Type Conference
Year 2007
Where ISCAS
Authors Jie Qin, Charles E. Stroud, Foster F. Dai
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