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    JETC
    2008
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    Parametric yield management for 3D ICs: Models and strategies for improvement

    13 years 4 months ago
    Parametric yield management for 3D ICs: Models and strategies for improvement
    Download  ic.engin.brown.edu
    Cesare Ferri, Sherief Reda, R. Iris Bahar
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    Added 13 Dec 2010
    Updated 13 Dec 2010
    Type Journal
    Year 2008
    Where JETC
    Authors Cesare Ferri, Sherief Reda, R. Iris Bahar
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