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DAC
2005
ACM

Path delay test compaction with process variation tolerance

8 years 7 months ago
Path delay test compaction with process variation tolerance
In this paper we propose a test compaction method for path delay faults in a logic circuit. The method generates a compact set of two-pattern tests for faults on long paths selected with a criterion. While the proposed method generates each two-pattern test for more than one fault in the target fault list as well as ordinary test compaction methods, secondary target faults are selected from the fault list such that many other faults, which may not be included in the fault list, are detected by the test pattern. Even if faults on long paths in a manufactured circuit are not included in the fault list due to a process variation or noise, the compact test set would detect the longer untargeted faults, i.e., the test set has a noise or variation tolerant nature. Experimental results show that the proposed method can generate a compact test set and it detects longer untargeted path delay faults efficiently. Categories and Subject Descriptors
Seiji Kajihara, Masayasu Fukunaga, Xiaoqing Wen, T
Added 13 Oct 2010
Updated 13 Oct 2010
Type Conference
Year 2005
Where DAC
Authors Seiji Kajihara, Masayasu Fukunaga, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato
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