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DATE
2009
IEEE

A physical-location-aware X-filling method for IR-drop reduction in at-speed scan test

13 years 11 months ago
A physical-location-aware X-filling method for IR-drop reduction in at-speed scan test
Wen-Wen Hsieh, I-Sheng Lin, TingTing Hwang
Added 20 May 2010
Updated 20 May 2010
Type Conference
Year 2009
Where DATE
Authors Wen-Wen Hsieh, I-Sheng Lin, TingTing Hwang
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