Polynomial Identity Testing for Depth 3 Circuits

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Polynomial Identity Testing for Depth 3 Circuits
We study the identity testing problem for depth 3 arithmetic circuits ( circuit). We give the first deterministic polynomial time identity test for circuits with bounded top fanin. We also show that the rank of a minimal and simple circuit with bounded top fanin, computing zero, can be unbounded. These results answer the open questions posed by Klivans-Spielman (STOC 2001) and Dvir-Shpilka (STOC 2005). Keywords. Identity testing, depth of circuits, Chinese remaindering, rings. Subject classification. Computer Science, Algebra.
Neeraj Kayal, Nitin Saxena
Added 13 Oct 2010
Updated 13 Oct 2010
Type Conference
Year 2006
Where COCO
Authors Neeraj Kayal, Nitin Saxena
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