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8

COCO
2006
Springer

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Polynomial Identity Testing for Depth 3 Circuits

13 years 6 months ago

Polynomial Identity Testing for Depth 3 Circuits

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We study the identity testing problem for depth 3 arithmetic circuits ( circuit). We give the first deterministic polynomial time identity test for circuits with bounded top fanin. We also show that the rank of a minimal and simple circuit with bounded top fanin, computing zero, can be unbounded. These results answer the open questions posed by Klivans-Spielman (STOC 2001) and Dvir-Shpilka (STOC 2005). Keywords. Identity testing, depth of circuits, Chinese remaindering, rings. Subject classification. Computer Science, Algebra.

Neeraj Kayal, Nitin Saxena

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Added	13 Oct 2010
Updated	13 Oct 2010
Type	Conference
Year	2006
Where	COCO
Authors	Neeraj Kayal, Nitin Saxena

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