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ICCAD
2000
IEEE

Potential Slack: An Effective Metric of Combinational Circuit Performance

13 years 9 months ago
Potential Slack: An Effective Metric of Combinational Circuit Performance
This paper proposes the concept of potential slack and show it is an effective metric of combinational circuit performance. We provide several methods for estimating potential slack and prove one (a maximal-independent-set based algorithm) in particular works best. Experiments in gate sizing show that potential slack provides 100% correct prediction for circuit area optimization. We also explore the role of potential slack in timing-driven placement.
Chunhong Chen, Xiaojian Yang, Majid Sarrafzadeh
Added 31 Jul 2010
Updated 31 Jul 2010
Type Conference
Year 2000
Where ICCAD
Authors Chunhong Chen, Xiaojian Yang, Majid Sarrafzadeh
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