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ISQED
2005
IEEE

Power Reduction in Test-Per-Scan BIST with Supply Gating and Efficient Scan Partitioning

13 years 9 months ago
Power Reduction in Test-Per-Scan BIST with Supply Gating and Efficient Scan Partitioning
Swarup Bhunia, Hamid Mahmoodi-Meimand, Debjyoti Gh
Added 25 Jun 2010
Updated 25 Jun 2010
Type Conference
Year 2005
Where ISQED
Authors Swarup Bhunia, Hamid Mahmoodi-Meimand, Debjyoti Ghosh, Kaushik Roy
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